Inseto
Power Discrete, FET, Diode ATE Test Equipment By Focused Test
Focused Test, Inc. (FTI) designs, manufactures and supports a family of power discrete and analog IC ATE. The company headquarters are located in Boulder, Colorado and their Asia engineering support center is located in Cabuyao, Philippines.
FTI was founded with the mission to apply a ‘Focused Technology’ approach to the design of production testers for power discrete devices and analog IC’s. Their goal is to offer targeted solutions that meet customers’ needs for low-cost test equipment for specific product segments. In this way, they provide the lowest acquisition price and highest throughput, along with an impressive array of test engineering tools.
FTI testers are based on a ‘Tester-per-Site’ design which uses the USB bus to allow easy system scalability for multisite applications. FTI testers can be easily configured to perform parallel tests with many different types of multisite handlers, including gravity, turret, strip and wafer ring handlers. FTI’s highly flexible ‘FTI Studio’ software is Dot Net based and has a multi-threaded architecture which allows the testers to easily perform parallel tests in many different multisite test modes including Index Parallel, with no test-time penalty.
In addition to best-in-class production test performance, the FTI also offers a feature-rich range of software engineering tools. These include Scope Tool, Data Sheet Tool, and a Parts Average Test (PAT) Tool that implements the AEC Q001 Rev C standard.
FTI’s unique design approach offers customers a lower cost-of-test per unit, thanks to its extremely low system acquisition price, high multisite throughput, and increased handler productivity.
Product range overview:
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FTI 1000 - MOSFET test system consists of independent
channel boards that allow all DC and AC MOSFET parameters to
be tested either separately, or in one handler insertion or
prober touch-down. The MOSFET AC parameters tested by the FTI
1000 include Inductive Load (UIL/UIS), Gate Charge (Qg, Qgs,
Qgd), Gate Resistance (Rg), and Switching Tests. FTI 1000 also
offers analog test resources to enable Driver-MOSFET devices
to be tested, such as products based on the Intel DrMOS standard.
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| The FTI 1000 test system can be configured to test diodes and TVS devices according to MIL Standard 750, Test methods include: *3101 -Thermal Impedance - Ztheta, *4051 - Dynamic Impedance - Zzt/Zzk, *4065 - Peak Reverse Power - Prp, *4066 - Current Pulse, *PRF 19500-533 - Noise Density | |
FTI
2000 - Power IC test system consists of one or more
channel boards each populated by up to four instrument modules.
FTI's 'Tester-per-Site' architecture based on the USB bus allows
one channel board to be dedicated to each handler site. This
provides a high degree of system scalability and excellent multisite
performance. FTI 2000 can test a wide range of devices, including
Power IC's, analog switches and op amps. |
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Further
Information On Focused Test ATE Equipment: |
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| Applications | Test
of Semiconductor Discrete Devices or Assemblies, Testing of
Power Electronic Devices or Assemblies, Test of Electronic Devices
or Assemblies, MIL Standard 750 ATE - Component Test System,
Zener Burn-In Diode Testers |
| Industry Segments | Semiconductor
Assembly, Power Device Manufactuers, Microelectronic Assembly,
Photonic Assembly, Automotive Components, Medical Components |
| Technical Advice | |
| Focused Test Website |  |
| Region | Available
from Inseto in the United Kingdom, Ireland & Scandinavia |
