Inseto UK - Automatic Optical Inspection Systems For Defect Analysis of Semiconductor Wafers

Camtek - 2D & 3D Wafer Inspection Systems

Camtek Ltd. develops and manufactures automatic optical inspection (AOI) and metrology systems for the inspection of finished semiconductor wafers.

Advanced packages, such as stacked die, 3D package, System-in Package (SIP), Flip-Chip and Fine-Pitch wire bonding are sensitive to defects in the die interconnect areas. Camtek inspection equipment assists wafer fabs, bumping houses providers and packaging foundries address these challenges with advanced systems that deliver outstanding 2D and 3D inspection and metrology capabilities. These systems fit right into the most advanced production environment, and handle bare and frame-mounted wafers up to 300mm in diameter

Systems are available for either 2D or 3D fully automatic wafer-level inspection and analysis or for cut quality defects (Kerf) and wafer surface defects after sawing.

Model Range Overview:


	Falcon 500 - is an advanced optical inspection systems for wafers before or after electrical / functional test. Designed to ensure known-good die, the Falcon 500 consistently detects visible defects that may impact die integrity or interconnect reliability. This high-throughout system is engineered to support in-line 100% inspection at production rates.	Detailed Overview & Datasheet

	Falcon 500PD is an advanced automatic framed wafer inspection system for detection and analysis of surface and probe mark defects, bump size and placement deviations, as well as dicing-related defects.	Detailed Overview & Datasheet

	Falcon 800 - is a line of advanced measurement and metrology systems for 3D inspection of bumped wafers ensuring that bumps meet their tight dimensional tolerances.	Detailed Overview & Datasheet
Further Information On Camtek
Applications / Uses	Semiconductor Wafer Defect Inspection Framed Wafer Defect Inspection Unframed Wafer Defect Inspection Wafer Probe Mark Inspection Post-Sawn Wafer Defect Inspection Bumped Wafer Inspection 2D Wafer Inspection 3D Wafer Inspection Top Side & Backside Wafer Inspection Wafer Metrology Systems Micro-level defect Inspection KGD - Known Good Die Inspection Semiconductor Quality Insurance & Process Control
Industry Segments	Semiconductor Wafer Fabrication Semiconductor Incoming Inspection Wafer Bumping Services Semiconductor Test & QA Houses
Technical Advice	enquiries@inseto.co.uk
Camtek Website