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Focused
Test - Power Discrete, Analog IC, ATE Test Equipment
Focused Test,
Inc. (FTI) designs, manufactures and supports a family of power
discrete and analog IC ATE. The company headquarters are located
in Boulder, Colorado and their Asia engineering support center is
located in Cabuyao, Philippines.
FTI
was founded with the mission to apply a ‘Focused Technology’
approach to the design of production testers for power discrete
devices and analog IC’s. Their goal is to offer targeted solutions
that meet customers’ needs for low-cost test equipment for
specific product segments. In this way, they provide the lowest
acquisition price and highest throughput, along with an impressive
array of test engineering tools.
FTI
testers are based on a ‘Tester-per-Site’ design which
uses the USB bus to allow easy system scalability for multisite
applications. FTI testers can be easily configured to perform parallel
tests with many different types of multisite handlers, including
gravity, turret, strip and wafer ring handlers. FTI’s highly
flexible ‘FTI Studio’ software is Dot Net based and
has a multi-threaded architecture which allows the testers to easily
perform parallel tests in many different multisite test modes including
Index Parallel, with no test-time penalty.
In addition
to best-in-class production test performance, the FTI also offers
a feature-rich range of software engineering tools. These include
Scope Tool, Data Sheet Tool, and a Parts Average Test (PAT) Tool
that implements the AEC Q001 Rev C standard.
FTI’s
unique design approach offers customers a lower cost-of-test per
unit, thanks to its extremely low system acquisition price, high
multisite throughput, and increased handler productivity.
Model Range
Overview:
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FTI
1000 MOSFET test system consists of independent channel boards
that allow all DC and AC MOSFET parameters to be tested either
separately, or in one handler insertion or prober touch-down.
The MOSFET AC parameters tested by the FTI 1000 include Inductive
Load (UIL/UIS), Gate Charge (Qg, Qgs, Qgd), Gate Resistance
(Rg), and Switching Tests. FTI 1000 also offers analog test
resources to enable Driver-MOSFET devices to be tested, such
as products based on the Intel DrMOS standard.
The
FTI 1000 test system can be configured to test diodes and
TVS devices according to MIL Standard 750.
Test
methods include:
*3101
-Thermal Impedance - Ztheta
*4051
- Dynamic Impedance - Zzt/Zzk
*4065
- Peak Reverse Power - Prp
*4066
- Current Pulse
*PRF 19500-533
- Noise Density
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 PDF Datasheet
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The
FTI 2000 Power IC test system consists of one or more channel
boards each populated by up to four instrument modules. FTI's
'Tester-per-Site' architecture based on the USB bus allows
one channel board to be dedicated to each handler site. This
provides a high degree of system scalability and excellent
multisite performance. FTI 2000 can test a wide range of devices,
including Power IC's, analog switches and op amps.
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PDF Datasheet
383Kb |
Further
Information On Focused Test, Inc. |
Applications
/ Uses |
Test
of Semiconductor Discrete Devices or Assemblies
Test
of Power Electronic Devices or Assemblies
Test
of Electronic Devices or Assemblies
MIL
Standard 750 ATE - Component Test System
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Industry
Segments |
Semiconductor
Assembly
Power
Semiconductor Assembly
Microelectronic
Assembly
Photonic
Assembly
Automotive
Components
Medical
Components
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Technical
Advice |
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Focused Test Website |
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