Application Specific & Custom Probing Equipment
SemiProbe recognizes that leading edge companies, innovators and research facilities are often challenged with difficult wafer probing and application specific testing requirements. To meet these needs, creative solutions must be engineered.
Utilising SemiProbe’s patented “Probe System for Life” platform, probe stations can easily be configured to meet application specific challenges. These same systems can then be easily modified or expanded as requirements change, or budgets allow. This advanced concept delivers dedicated solutions, that help lower your cost of ownership and test.
SemiProbe’s range of customised and application specific wafer probing solutions include: Vacuum Probe Stations, Magnetic Stimulation Systems, Double Sided Probing Systems, Optoelectronic and Photonics Wafer Probe Systems, High Voltage and High Current Testers etc.
Need an application specific probe station, please contact us or complete the request form below with your requirements.
Modular Probe System for Life “PS4L”
The probe station that allows customers to configure and purchase a system according to their exact requirements.
High Power Probing Systems
High Power Wafer Probing equipment for up to 10KV-500A in manual to automatic configurations.
Optoelectronic Probing Systems
SemiProbe has pioneered electro-optical methods and capabilities for testing optoelectronic and photonic components at wafer level.
HF/RF Wafer Probe
High frequency (HF) and radio frequency (RF) wafer probing equipment from DC to over 500 GHz.
MEMS Probing Equipment
MEMS and MOEMS wafer probe equipment, including double sided probing, vacuum and cryo test modules.
Magnetic Stimulation System
The PS4L-MSS enables researchers to move and control a magnetic stimulation source under the DUT.
Vacuum Probing Systems
SemiProbe’s dual stage vacuum probing systems is available in either semiautomatic or fully automatic configurations.
See the full Semiprobe Wafer Probers product range
Tel: +44 (0)1264 334505
Microelectronic Devices, Multi-Chip-Modules Testing, Semiconductor Wafer Probe, Device Development & Characterisation, RF-HF Devices, Bio Medical Assemblies, Nano Electronics, Packaged Device Test, MEMS, Spintronics, Carbon NanoTube, Semiconductor Components, Research Testing, Microfluidic Testing, Photovoltaic Device Test etc.
Universities, Research Development & Characterisation, Production Test, Semiconductor Production, Medical, Photonics, Solar Cell, Nanoelectronics, Fibre Optics, Microwave Electronics, Microelectronics, Power Semiconductor Assembly, Power Electronics
United Kingdom, Ireland & Scandinavia/Nordic Regions: Finland, Sweden, Norway & Denmark