Semiautomatic Wafer Probe Equipment: PS4L-SA

PS4L-SA Key Features

  • Modular semiautomatic wafer probe equipment
  • Configured according to application requirements
  • For analytical characterisation and production probing
  • Probe individual die, partial and full wafers up to 300 mm
  • Extensive range of field upgrade options and features
  • Modern software with open architecture
  • Robust, reliable, easy to use, program and interface

SemiProbe produce a full range of semiautomatic wafer probe equipment ideal for Research Centres, Universities, Laboratories and for production test, based on their modular Probe System for Life (PS4L) platform, allowing users to configure a semiconductor probe station according to their exact requirements.

The product range includes semiautomatic probe stations for up to 100, 150, 200 & 300 mm wafers, with a modular design that enables future upgrades for larger wafer sizes, automation and functionality, or where additional or different test resources and requirements are needed.

All of the basics components, including the bases, stages, chucks, microscope mounts and manipulators, are interchangeable, upgradeable, and configurable. With its extensive range of hardware and software options, systems can be configured to suit virtually any application including research, characterization, verification, failure analysis and development can be performed, on a wide variety of semiconductor devices, materials and applications.

All of SemiProbe’s semiautomatic wafer probing equipment utilizes their advanced Pilot Control Software, a DLL based open architecture system, which allows easy communications and integration of new features, capabilities and accessories, with a minimum of time, money and effort.

SemiProbe’s compact semiautomatic wafer probers are reliable, easy to setup and operate with a rigid design for repeatable results and feature the following capabilities:

  • Adaptive modular hardware and software architecture
  • 100, 150, 200, 300 mm Versions
  • Compact, reliable and rigid design
  • Field upgradeable (wafer size and/or functionality)
  • Fast, accurate and repeatable performance
  • Ideal replacement for old Legacy Probers
  • PILOT Prober Control Software
  • Easy alignment, set up and operation
  • Remote interface options (TTL, RS232C, GPIB,TCP/IP)
  • DC to Terahertz
  • Hot/Cold Chamber options or upgrades
  • Custom configured for your needs and application

Example Applications

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Microelectronic Devices, Multi-Chip-Modules Testing, Semiconductor Wafer Probe, Device Development & Characterisation, RF-HF Devices, Bio Medical Assemblies, Nanoelectronics, Packaged Device Test, MEMS, Spintronics, Carbon NanoTube, Semiconductor Components, Research Testing, Microfluidic Testing, Photovoltaic Device Test etc.

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University Research, Development & Characterisation, Production Test, Semiconductor Production, Medical, Photonics, Solar Cell, Nanoelectronics, Microwave Electronics, Microelectronics, Power Semiconductor Assembly, Power Electronics

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