SemiProbe provides a family of fully automatic wafer probing systems with several unique models to choose from. They are robust, high speed solutions for analytical or production probing and are equipped with cassette holders, pre-aligners, and robotic systems with end effectors designed specifically for the application.
The product range includes automatic probers for 100, 150, 200, 300mm and 450mm wafers, with a modular design that enables future upgrades for functionality, or where additional or different test resources and requirements are needed.
A Known Good Die (KGD) option for Stretch Wafer Frames rapidly learns the position of each die (X, Y, Theta), and probes them at high speed. All models support inking, wafer mapping and contact sense. The easy to learn and use PILOT™ control software makes the systems simple to setup, interface to and operate.
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Tel: +44 (0)1264 334505
Microelectronic Devices, Multi-Chip-Modules Testing, Semiconductor Wafer Probe, Device Development & Characterisation, RF-HF Devices, Bio Medical Assemblies, Nanoelectronics, Packaged Device Test, MEMS, Spintronics, Carbon NanoTube, Semiconductor Components, Research Testing, Microfluidic Testing, Photovoltaic Device Test etc
Production Test, Semiconductor Production, Medical, Photonics, Solar Cell, Nanoelectronics, RF Electronics, Microelectronics, Power Semiconductor etc.
United Kingdom, Ireland & Scandinavia/Nordic Regions: Finland, Sweden, Norway & Denmark