Simultaneous Double Sided Prober (DSP)

SIMULTANEOUS DOUBLE SIDED PROBER (DSP)

SemiProbe manufactures a line of manual and semiautomatic double sided probing systems (DSP) used primarily for Failure Analysis and MEMS applications. The DSP system allows the user the flexibility to probe from the top and bottom sides. In some cases an emission microscope or a solar simulator will be mounted on one side and the other side would be the bias or electrical stimulation side. The DSP has both topside and bottom-side optics that provides the ability to view both sides independently or at the same side.

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Tel: +44 (0)1264 334505

Email: enquiries@inseto.co.uk

Applications

Testing Wafers, Optical Devices, Silicon Photonics etc.

Industry Segments

University Research, Development & Characterisation Test

Technical Papers

SemiProbe Website

Region

United Kingdom, Ireland & Scandinavia/Nordic Regions: Finland, Sweden, Norway & Denmark

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Telephone:
+44 (0)1264 334505

Email:
enquiries@inseto.co.uk

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