Optoelectronic Probing Systems

OPTOELECTRONIC & SILICON PHOTONIC PROBING SYSTEMS

SemiProbe has pioneered new electro-optical methods and capabilities for testing optoelectronic and photonic components at wafer level and has extensive experience testing silicon devices and compound materials, including light emitting diodes (LED), vertical cavity surface emitting lasers (VCSEL) and photo diodes etc.

Their unique integrating sphere holder enables users to utilize the same PS4L system for horizontal (EELD) and vertical (VCSEL, LED) testing in either a manual or semiautomatic configuration. SemiProbe have created wafer maps capable of mapping >100k die, unique chuck systems to handle fragile or broken wafers, high speed stages and software to increase throughput.

Further developments also include manual, semi and fully automatic top and bottom side probing (DSP), vacuum probing, sub-micron fibre alignment for silicon photonic devices using manual or automated multi-axis positioners and laser measurement for continuous adjustment of wafer planarity.

  • Manual, semi and fully automated electro-optical systems
  • Multiple applications: SSP, DSP, Vacuum, HF, OPTO & more
  • Light measurements via Fibre or Integrating Sphere etc.
  • Test single die, laser bars, partial or full wafer up to 300 mm
  • Extensive range of options and features
  • Low cost and field upgradeable

FURTHER INFORMATION & REQUEST FORM:

Contact Us

Tel: +44 (0)1264 334505

Email: enquiries@inseto.co.uk

Applications

Testing Power LED's, VCSELS, Lasers, Photo Diodes, Silicon Photonics etc.

Industry Segments

University Research, Development, Characterisation Test, Photonics, LED Production etc.

SemiProbe Website

Region

United Kingdom, Ireland & Scandinavia/Nordic Regions: Finland, Sweden, Norway & Denmark

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Telephone:
+44 (0)1264 334505

Email:
enquiries@inseto.co.uk

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