SemiProbe's dual stage vacuum probing systems in either manual or semiautomatic configurations, is designed to deliver high performance and accuracy testing of IR sensors, accelerometers, micro-bolometers and other devices affected by the resistance of normal atmosphere, before expensive packaging. SemiProbes Vacuum Prober is based on their PS4L adaptive architecture, where all components are interchangeable and field upgradeable.
The system is ideal for research, laboratory or pilot production applications. The interchangeable modules makes it easy to convert to provide testing solutions for a variety of applications - DC, HF, OPTO, MEMS, Nanotechnology, including wafers or substrates up to 200 mm. With a comprehensive portfolio of optional accessories and upgrades, the Vacuum Probing System can be easily customized to meet a variety of applications and budgets, now and in the future.
FURTHER INFORMATION & REQUEST FORM:
Tel: +44 (0)1264 334505
Wafer Probe Testing of MEMS, Sensors, Switches, Microbolometers, or any product that is vacuum-packaged, Vacuum Testing Semiconductor Wafers, Vacuum Wafer Probe of Silicon or IIIV Wafers etc.
University Research, Development & Characterisation Test, Semiconductor Wafer Probe
Available from Inseto in the United Kingdom, Ireland & Scandinavia